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The use of the scanning electron microscope By J. W. S. Hearle, J. T. Sparrow, and P. M. Cross

Main Author:
Hearle, J. W. S.
Other Authors:
Sparrow, J. T. and Cross, P. M.
Format:
Book
Language:
English
Subjects:
Scanning electron microscopes
View in NAL's Catalog:
CAT73505637