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Proceedings : 1977 IEEE Computer Society Conference on Pattern Recognition and Image Processing, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York. -

Other Authors:
IEEE Computer Society Conference on Pattern Recognition and Image Processing and IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.
Format:
Book
Language:
English
Subjects:
Pattern recognition systems Congresses
Imaging systems Congresses
View in NAL's Catalog:
CAT78699202