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Introduction to statistical pattern recognition with applications in the Large Area Crop Inventory Experiment /

Main Author:
Chang, C. Y.
Other Authors:
Lockheed Electronics Company. and United States. Earth Observations Programs Division.
Format:
Book
Language:
English
Subjects:
Agriculture Remote sensing Statistics
Agriculture Statistics
Artificial satellites in agriculture
Crop yields
View in NAL's Catalog:
CAT87879047