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Lines for improved yield and value-added traits results from GEM

Journal Title:
Report of the 53rd annual Corn and Sorghum Research Conference : held in Chicago, Illinois, December 9-10, 1998 / organized and sponsored by the Corn & Sorghum Division of the American Seed Trade Association.
Main Author:
Pollak, Linda M.
Other Authors:
Salhuana, Wilfredo
Format:
Electronic
Language:
English
Subjects:
Zea mays
germplasm
research projects
genetic improvement
cooperative research
plant breeding
Agricultural Research Service
plant genetic resources
lines
traits
value-added products
yields
disease resistance
pest resistance
corn
hybrids
product quality
chemical composition
View in NAL's Catalog:
IND44427313